Pattern Recognition and Image Analysis

ISSN PRINT: 1054-6618
ISSN ONLINE: 1555-6212


Pattern Recognition and Image Analysis: Advances in Mathematical Theory and Applications is a per reviewed international journal featuring top papers in pattern recognition and image, analysis, understanding, and processing of images. Emphasis is laid on rapid publishing of concise articles covering theory, methodology, and applications. Major topics include mathematical theory of pattern recognition and image analysis, raw data representation, computer vision, image mining, processing and understanding, machine learning, computer graphics, forecasting, data and knowledge bases, data mining, neural nets, artificial intelligence, software, specialized computer architectures, applications, and related areas.

Pattern Recognition and Image Analysis is abstracted and/or indexed in:
ACM Digital Library, Academic OneFile, CSA, EI-Compendex, Gale, Google Scholar, INSPEC, OCLC, PASCAL, ProQuest, SCImago, SCOPUS, Summon by ProQuest.


Dorodnicyn Computing Center of the RAS, Moscow, Russia
ul.Vavilova 40, Moscow GSP-1, 119991 Russia
Tel: +7 (499) 135-9033, 135-8831
Fax: +7 (499) 135-9033

Editorial Board


Yuri I. Zhuravlev, Prof., Full Member of the RAS


Sergey V. Ablameyko, Prof., Full Member of the NASB, Belarus State University, Minsk, Belarus; Gunilla Borgefors, Prof., Swedish University of Agricultural Sciences, Uppsala, Sweden; Horst Bunke, Prof., University of Bern, Switzerland; Gennadii M. Emelyanov, Prof., Yaroslav-the-Wise Novgorod State University, Velikii Novgorod, Russia; Stanislav V. Emelyanov, Prof., Full Member of the RAS, Institute of Systems Research, RAS, Moscow, Russia; Olivier Faugeras, Prof., The French National Institute for Research in Computer Science and Control, Sophia Antipolis Research Unit, France; Goesta H. Granlund, Prof., Linkoping University, Sweden; Igor B. Gurevich, Dr. (Eng.),Deputy Editor-in-Chief, Dorodnicyn Computing Center, RAS, Moscow, Russia; Heikki Kalviainen, Prof., Lappeenranta University of Technology, Finland; Valerii S. Kirichuk, Prof., Institute of Automation and Electrometry, SB RAS, Novosibirsk, Russia; Josef Kittler, Prof., University of Surrey, Guildford, UK; Valerii G. Labunets, Prof., Ural State Technical University, Yekaterinburg, Russia; Dwijesh Dutta Majumder, Prof., Indian Statistical Institute, Calcutta, India; Vladimir D. Mazurov, Prof., Ural State University, Yekaterinburg, Russia; Gerard Medioni, Prof., University of Southern California, Los Angeles, USA; Eugene A. Metlitski, Prof., ARC International, San Jose, USA; Eckart Michaelsen, Prof., Fraunhofer Institute of Optronics, System Technologies and Image Exploitation, Germany; Anatolii P. Nemirko, Prof., St. Petersburg Electrotechnical University “LETI”, Russia; Heinrich Niemann, Prof., Dr. (Ing.), University of Erlangen-Nuremberg, Germany; Yurii V. Obukhov, Prof., Institute of Radioengineering and Electronics, RAS, Moscow, Russia; Erkki Oja, Prof., Helsinki University of Technology, Finland; Jussi Parkkinen, Prof., University of Joensuu, Finland; Dietrich Paulus, Prof., Institute for Computational Visualistics at the University of Kobkenz-Landau, Germany; Petra Perner, Dr. Sci., Institute of Computer Vision and Applied Computer Sciences, Leipzig, Germany; Igor G. Persiantsev, Prof., Moscow State University, Russia; Yurii P. Pyt’ev, Prof., Moscow State University, Russia; Bernd Radig, Prof., Technical University of Munich, Germany; Lyudmila V. Raevskaya, Executive Secretary, Dorodnicyn Computing Center, RAS, Moscow, Russia; Gerhard X. Ritter, Prof., University of Florida, Gainsville, USA; Vladimir V. Ryazanov, Dr. Sci., Dorodnicyn Computing Center, RAS, Moscow, Russia; Ovidio Salvetti, Prof., Institute of Information Science and Technologies “A. Faedo”, Italian NRC, Pisa, Italy; Gennadii I. Savin, Full Member of the RAS, Interagency Supercomputer Center, RAS, Moscow, Russia; Oleg V. Senko, Dr. Sci., Dorodnicyn Computing Center, RAS, Moscow, Russia; Vladislav V. Sergeyev, Prof., Image Processing Systems Institute, RAS, Samara, Russia; Igor N. Sinitsyn, Prof., Institute for Computer Science Problems, RAS, Moscow, Russia; Victor A. Soifer, Prof., Corresponding Member of the RAS, Image Processing Systems Institute, RAS, Samara, Russia;Clayton Stewart, Dr. Sci., Science Application International Corporation, Arlington, USA; Thomas Tolxdorff, Prof., Free University of Berlin, Germany; Yurii G. Vasin, Prof., Lobachevskii Nizhni Novgorod State University, Russia; Vladimir I. Vasilyev, Prof., Glushkov Institute of Cybernetics, NASU, Kiev, Ukraine; Vera V. Yashina, Dr. Sci., Dorodnicyn Computing Center, RAS, Moscow, Russia; Ian T. Young, Prof., Delft University of Technology, The Netherlands; Nikolai G. Zagoruiko, Prof., Sobolev Institute of Mathematics, SB RAS, Novosibirsk, Russia; Aleksei B. Zhizhchenko, Prof., Corresponding Member of the RAS, Center of Scientific Telecommunications and InformationTechnologies, RAS, Moscow, Russia.

Guidelines for Authors

1. Each manuscript should comply with guidelines for authors. Please see also information on the style file, text preparation, and illustrations.

2. The manuscript should be submitted by e-mail to the address only.

3. The manuscript should be accompanied by:

brief biographies of all authors including the following data:

  • family name and proper name;
  • date of birth;
  • place (university) and date of getting diploma;
  • place (university/scientific institution) and date of getting PhD and other scientific degrees;
  • affiliation (full name, mail address, position);
  • fields of research priorities;
  • number of scientific publications (monographs, papers in peer-reviewed journals and international conference proceedings);
  • membership in academies of sciences and in scientific societies;
  • membership in editorial boards of peer-reviewed international journals;
  • scientific awards and prizes;
  • digital photographs of all authors (size 3 × 4).

The copyright transfer agreement properly filled and signed.

Author's Agreement Form


2016, Volume 26 (4 issues)

The journal is available online by subscription

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